With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.
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With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.
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Add this copy of Materials Reliability Issues in Microelectronics: to cart. $25.00, like new condition, Sold by Powell's Books Chicago rated 5.0 out of 5 stars, ships from Chicago, IL, UNITED STATES, published 1991 by Materials Research Society.
Add this copy of Materials Reliability Issues in Microelectronics: to cart. $25.00, good condition, Sold by Powell's Books Chicago rated 5.0 out of 5 stars, ships from Chicago, IL, UNITED STATES, published 1991 by Materials Research Society.
Add this copy of Materials Reliability Issues in Microelectronics: to cart. $17.49, very good condition, Sold by GuthrieBooks rated 4.0 out of 5 stars, ships from Spring Branch, TX, UNITED STATES, published 1991 by Cambridge University Press.
Add this copy of Materials Reliability Issues in Microelectronics: to cart. $47.95, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 1991 by Cambridge University Press.
