Edition
ISBN: 1558991190 /
ISBN-13: 9781558991194
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- Edition:
- 1991, Materials Research Society
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Fine/Like New
- Available Copies: 10+
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- Details:
- ISBN:
1558991190
- ISBN-13:
9781558991194
- Publisher:
Materials Research Society
- Published:
1991
- Language:
English
- Alibris ID:
14893365115
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- Seller's Description:
- Like New. 1991. Small publisher's mark on bottom of text block. Otherwise, Fine.
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- Edition:
- 1991, Materials Research Society
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Hardcover,
Good
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- Details:
- ISBN:
1558991190
- ISBN-13:
9781558991194
- Publisher:
Materials Research Society
- Published:
1991
- Language:
English
- Alibris ID:
14893408517
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- Shipping Options:
- Standard Shipping: $4.73
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- Seller's Description:
- Good. 1991. Hardcover. Good.
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Hardcover,
Very Good
Materials Reliability Issues in Microelectronics: Volume 225 (Mrs Proceedings)
by Lloyd, James R. [Editor]; Yost, Frederick G. [Editor]; Ho, Paul S. [Editor];
1991, Cambridge University Press
ISBN-13:
9781558991194
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GuthrieBooks
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Spring Branch,
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$17.50
$39.99
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- Edition:
- 1991, Cambridge University Press
-
Hardcover,
Very Good
|
- Details:
- ISBN:
1558991190
- ISBN-13:
9781558991194
- Publisher:
Cambridge University Press
- Published:
Oct/1991
- Language:
English
- Alibris ID:
12795817971
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- Shipping Options:
- Standard Shipping: $4.73
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- Seller's Description:
- Very Good. Size: 6x1x9; Ex-Library hardcover no dj (black boards) in very nice condition with all the usual markings and attachments.
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| Hide Details ▴ |
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- Edition:
- 1991, Cambridge University Press
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Hardcover,
Good
|
- Details:
- ISBN:
1558991190
- ISBN-13:
9781558991194
- Publisher:
Cambridge University Press
- Published:
1991
- Language:
English
- Alibris ID:
17574827517
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- Shipping Options:
- Standard Shipping: $4.73
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- Seller's Description:
- Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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