Books
ISBN: 9781558991194
Edition
ISBN:
1558991190 /
ISBN-13:
9781558991194
Book Details
Seller
Sort
U.K./EUR Sellers
Price: Low to High
Price: High to Low
Condition
Condition: Reverse
Pub Date
Pub Date: Reverse
Sellers Near Me
Fine/Like New
Materials Reliability Issues in Microelectronics: Volume 225 (Mrs Proceedings)
by Lloyd, Jame
1991, Materials Research Society
ISBN-13:
9781558991194
See Item Details ▾
Powell's Books Chicago
BEST
Chicago,
IL,
USA
$25.00
$39.99
Add to Basket
Add this copy of Materials Reliability Issues in Microelectronics: to cart. $25.00, like new condition, Sold by Powell's Books Chicago rated 5.0 out of 5 stars, ships from Chicago, IL, UNITED STATES, published 1991 by Materials Research Society.
Edition:
1991, Materials Research Society
Fine/Like New
Available Copies: 10+
Details:
ISBN:
1558991190
ISBN-13:
9781558991194
Publisher:
Materials Research Society
Published:
1991
Language:
English
Alibris ID:
14893365115
Shipping Options:
Standard Shipping: $4.58
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Like New. 1991. Small publisher's mark on bottom of text block. Otherwise, Fine.
Hide Details ▴
Hardcover,
Good
Materials Reliability Issues in Microelectronics: Volume 225 (Mrs Proceedings)
by Lloyd, Jame
1991, Materials Research Society
ISBN-13:
9781558991194
See Item Details ▾
Powell's Books Chicago
BEST
Chicago,
IL,
USA
$25.00
$39.99
Add to Basket
Add this copy of Materials Reliability Issues in Microelectronics: to cart. $25.00, good condition, Sold by Powell's Books Chicago rated 5.0 out of 5 stars, ships from Chicago, IL, UNITED STATES, published 1991 by Materials Research Society.
Edition:
1991, Materials Research Society
Hardcover,
Good
Details:
ISBN:
1558991190
ISBN-13:
9781558991194
Publisher:
Materials Research Society
Published:
1991
Language:
English
Alibris ID:
14893408517
Shipping Options:
Standard Shipping: $4.58
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Good. 1991. Hardcover. Good.
Hide Details ▴
Hardcover,
Very Good
Materials Reliability Issues in Microelectronics: Volume 225 (Mrs Proceedings)
by Lloyd, James R. [Editor]; Yost, Frederick G. [Editor]; Ho, Paul S. [Editor];
1991, Cambridge University Press
ISBN-13:
9781558991194
See Item Details ▾
GuthrieBooks
HIGH
Spring Branch,
TX,
USA
$17.49
$39.99
Add to Basket
Add this copy of Materials Reliability Issues in Microelectronics: to cart. $17.49, very good condition, Sold by GuthrieBooks rated 4.0 out of 5 stars, ships from Spring Branch, TX, UNITED STATES, published 1991 by Cambridge University Press.
Edition:
1991, Cambridge University Press
Hardcover,
Very Good
Details:
ISBN:
1558991190
ISBN-13:
9781558991194
Publisher:
Cambridge University Press
Published:
Oct/1991
Language:
English
Alibris ID:
12795817971
Shipping Options:
Standard Shipping: $4.58
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Very Good. Size: 6x1x9; Ex-Library hardcover no dj (black boards) in very nice condition with all the usual markings and attachments.
Hide Details ▴
Hardcover,
Good
Materials Reliability Issues in Microelectronics: Volume 225 (Mrs Proceedings)
1991, Cambridge University Press
ISBN-13:
9781558991194
See Item Details ▾
Bonita
HIGH
Newport Coast,
CA,
USA
$47.95
Add to Basket
Add this copy of Materials Reliability Issues in Microelectronics: to cart. $47.95, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 1991 by Cambridge University Press.
Edition:
1991, Cambridge University Press
Hardcover,
Good
Details:
ISBN:
1558991190
ISBN-13:
9781558991194
Publisher:
Cambridge University Press
Published:
1991
Language:
English
Alibris ID:
17574827517
Shipping Options:
Standard Shipping: $4.58
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Hide Details ▴