This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.
Read More
This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.
Read Less
Add this copy of Transmission Electron Microscopy and Diffractometry of to cart. $73.11, like new condition, Sold by Media Smart rated 4.0 out of 5 stars, ships from Hawthorne, CA, UNITED STATES, published 2001 by Springer.
Add this copy of Transmission Electron Microscopy and Diffractometry of to cart. $132.58, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2014 by Springer.
Add this copy of Transmission Electron Microscopy and Diffractometry of to cart. $134.53, very good condition, Sold by LLU- BOOKSERVICE ANTIQUARIAN rated 1.0 out of 5 stars, ships from Wahlstedt, S-H, GERMANY, published 2008 by Springer.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Very good. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Add this copy of Transmission Electron Microscopy and Diffractometry of to cart. $136.48, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2001 by Springer.
Add this copy of Transmission Electron Microscopy and Diffractometry of to cart. $160.76, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2012 by Springer.
![Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe] Brent Fultz (Autor), James Howe (Autor) This Hugely Successful and Highly Acclaimed Text is Designed to Meet the Needs of Materials Scientists at All Levels...](https://www2.alibris-static.com/imageid/2080754986_t.jpg)
