Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe] Brent Fultz (Autor), James Howe (Autor) This Hugely Successful and Highly Acclaimed Text is Designed to Meet the Needs of Materials Scientists at All Levels...
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Seller's Description:
Very good in very good dust jacket. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
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Seller's Description:
100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out by Amazon directly with free tracking.