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Transmission Electron Microscopy and Diffractometry of Materials (4th 2013 edition)

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Transmission Electron Microscopy and Diffractometry of Materials - Fultz, Brent, and Howe, James
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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with ...

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Transmission Electron Microscopy and Diffractometry of Materials 2014, Springer, Berlin, Heidelberg

ISBN-13: 9783642433153

4th 2013 edition

Trade paperback

Transmission Electron Microscopy and Diffractometry of Materials 2012, Springer, Berlin, Heidelberg

ISBN-13: 9783642297601

4th 2013 edition

Hardcover

Transmission Electron Microscopy and Diffractometry of Materials 2007, Springer

ISBN-13: 9783540738855

3rd edition

Hardcover

Transmission Electron Microscopy and Diffractometry of Materials 2005, Springer, Berlin, Germany

ISBN-13: 9783540437642

2nd 2002

Hardcover

Transmission Electron Microscopy and Diffractometry of Materials 2001, Springer, Berlin, Germany

ISBN-13: 9783540678410

Hardcover