This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.
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This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.
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Edition: 2014, Springer
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Available Copies: 5
Details: ISBN:
3642433154
ISBN-13:
9783642433153
Pages:
764
Edition:
4th 2013 edition
Publisher:
Springer
Published:
2014
Language:
English
Alibris ID:
17980634909
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Seller's Description: New. Trade paperback (US). Glued binding. 764 p. Contains: Unspecified. Graduate Texts in Physics.
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Edition: 2014, Springer
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Details: ISBN:
3642433154
ISBN-13:
9783642433153
Pages:
764
Edition:
4th 2013 edition
Publisher:
Springer
Published:
2014
Language:
English
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16053386620
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Seller's Description: New. Trade paperback (US). Glued binding. 764 p. Contains: Unspecified. Graduate Texts in Physics.
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Edition: 2014, Springer
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Available Copies: 10+
Details: ISBN:
3642433154
ISBN-13:
9783642433153
Pages:
764
Edition:
4th 2013 edition
Publisher:
Springer
Published:
2014
Language:
English
Alibris ID:
17384154304
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Edition: 2014, Springer
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Details: ISBN:
3642433154
ISBN-13:
9783642433153
Pages:
764
Edition:
4th 2013 edition
Publisher:
Springer
Published:
2014
Language:
English
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17946205473
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Edition: 2014, Springer
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Details: ISBN:
3642433154
ISBN-13:
9783642433153
Pages:
764
Edition:
4th 2013 edition
Publisher:
Springer
Published:
2014
Language:
English
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17946205474
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Edition: 2012, Springer
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3642297609
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9783642297601
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4th 2013 edition
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Springer
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2012
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17962704163
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3642297609
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9783642297601
Pages:
764
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4th 2013 edition
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Springer
Published:
2012
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English
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11557099944
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3642297609
ISBN-13:
9783642297601
Pages:
764
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4th 2013 edition
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Springer
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2012
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English
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17980303274
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Edition: 2012, Springer
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Details: ISBN:
3642297609
ISBN-13:
9783642297601
Pages:
764
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4th 2013 edition
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Springer
Published:
2012
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English
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17383639934
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Details: ISBN:
3540738851
ISBN-13:
9783540738855
Pages:
758
Edition:
3rd edition
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Springer
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Auflage: 3rd ed. 2008. Corr.
Language:
English
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16434852096
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Seller's Description: Very good in very good dust jacket. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
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ISBN-13: 9783642433153
4th 2013 edition
Trade paperback
ISBN-13: 9783642297601
4th 2013 edition
Hardcover
ISBN-13: 9783540738855
3rd edition
Hardcover
ISBN-13: 9783540678410
Hardcover
All Editions of Transmission Electron Microscopy and Diffractometry of Materials
![Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe] Brent Fultz (Autor), James Howe (Autor) This Hugely Successful and Highly Acclaimed Text is Designed to Meet the Needs of Materials Scientists at All Levels...](https://www3.alibris-static.com/imageid/2050143376_t.jpg)
