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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
by Brodusch, Nicolas, and DeMers, Hendrix, and Gauvin, Raynald
2017, Springer
ISBN-13:
9789811044328
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Details: ISBN:
9811044325
ISBN-13:
9789811044328
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Seller's Description: New. Print on demand Trade paperback (US). Glued binding. 137 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, color. Springerbriefs in Applied Sciences and Technology.
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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology)
by Brodusch, Nicolas
2017, Springer
ISBN-13:
9789811044328
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9811044325
ISBN-13:
9789811044328
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Springer
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2017
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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology)
by Brodusch, Nicolas
2017, Springer
ISBN-13:
9789811044328
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Add this copy of Field Emission Scanning Electron Microscopy: New to cart. $82.97, new condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2017 by Springer.
Edition: 2017, Springer
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Details: ISBN:
9811044325
ISBN-13:
9789811044328
Edition:
2018 edition
Publisher:
Springer
Published:
2017
Language:
English
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