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ISBN: 9789811044328
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9789811044328
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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
by Brodusch, Nicolas, and DeMers, Hendrix, and Gauvin, Raynald
2017, Springer
ISBN-13:
9789811044328
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Seller's Description: New. Trade paperback (US). Glued binding. 137 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, color. Springerbriefs in Applied Sciences and Technology.
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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
by Brodusch, Nicolas, and DeMers, Hendrix, and Gauvin, Raynald
2017, Springer
ISBN-13:
9789811044328
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Seller's Description: New. Trade paperback (US). Glued binding. 137 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, color. Springerbriefs in Applied Sciences and Technology. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
by Brodusch, Nicolas, and DeMers, Hendrix, and Gauvin, Raynald
2017, Springer
ISBN-13:
9789811044328
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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
by Brodusch, Nicolas, and DeMers, Hendrix, and Gauvin, Raynald
2017, Springer
ISBN-13:
9789811044328
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9789811044328
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2017
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Seller's Description: New. Trade paperback (US). Glued binding. 137 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, color. Springerbriefs in Applied Sciences and Technology. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
by Brodusch, Nicolas, and DeMers, Hendrix, and Gauvin, Raynald
2017, Springer
ISBN-13:
9789811044328
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9811044325
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9789811044328
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2018 edition
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Springer
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2017
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English
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