Edition
ISBN:
9811044325 /
ISBN-13:
9789811044328
Book Details
Seller
Sort
U.K./EUR Sellers
Price: Low to High
Price: High to Low
Pub Date
Pub Date: Reverse
Sellers Near Me
Paperback,
New
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
by Brodusch, Nicolas, and DeMers, Hendrix, and Gauvin, Raynald
2017, Springer
ISBN-13:
9789811044328
See Item Details ▾
GreatBookPrices
HIGH
Columbia,
MD,
USA
$82.13
Edition: 2017, Springer
Paperback,
New
Available Copies: 3
Details: ISBN:
9811044325
ISBN-13:
9789811044328
Edition:
2018 edition
Publisher:
Springer
Published:
2017
Language:
English
Alibris ID:
17575439729
Shipping Options: Standard Shipping: $4.68
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Trade paperback (US). Glued binding. 137 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, color. Springerbriefs in Applied Sciences and Technology. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Hide Details ▴
Paperback,
New
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
by Brodusch, Nicolas, and DeMers, Hendrix, and Gauvin, Raynald
2017, Springer
ISBN-13:
9789811044328
See Item Details ▾
Alibris
BEST
NV, USA
$84.14
Edition: 2017, Springer
Paperback,
New
Available Copies: 10+
Details: ISBN:
9811044325
ISBN-13:
9789811044328
Edition:
2018 edition
Publisher:
Springer
Published:
2017
Language:
English
Alibris ID:
14290489031
Shipping Options: Standard Shipping: $4.68
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Print on demand Trade paperback (US). Glued binding. 137 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, color. Springerbriefs in Applied Sciences and Technology.
Hide Details ▴
Paperback,
New
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
by Brodusch, Nicolas, and DeMers, Hendrix, and Gauvin, Raynald
2017, Springer
ISBN-13:
9789811044328
See Item Details ▾
Ria Christie Books
BEST
Uxbridge,
MIDDLESEX,
UNITED KINGDOM
$85.96
Edition: 2017, Springer
Paperback,
New
Available Copies: 10+
Details: ISBN:
9811044325
ISBN-13:
9789811044328
Edition:
2018 edition
Publisher:
Springer
Published:
2017
Language:
English
Alibris ID:
17384858921
Shipping Options: Standard Shipping: $4.68
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Trade paperback (US). Glued binding. 137 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, color. Springerbriefs in Applied Sciences and Technology.
Hide Details ▴
Paperback,
New
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization
by Brodusch, Nicolas, and DeMers, Hendrix, and Gauvin, Raynald
2017, Springer
ISBN-13:
9789811044328
See Item Details ▾
GreatBookPricesUK5
HIGH
Castle Donington,
DERBYSHIRE,
UNITED KINGDOM
$87.11
Edition: 2017, Springer
Paperback,
New
Available Copies: 3
Details: ISBN:
9811044325
ISBN-13:
9789811044328
Edition:
2018 edition
Publisher:
Springer
Published:
2017
Language:
English
Alibris ID:
17575543331
Shipping Options: Standard Shipping: $4.68
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Trade paperback (US). Glued binding. 137 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, color. Springerbriefs in Applied Sciences and Technology. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Hide Details ▴
Edition: 2017, Springer
Paperback,
New
Available Copies: 5
Details: ISBN:
9811044325
ISBN-13:
9789811044328
Edition:
2018 edition
Publisher:
Springer
Published:
10/6/2017
Language:
English
Alibris ID:
18060234390
Shipping Options: Standard Shipping: $4.68
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New in New jacket. Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Paperback or Softback)
Hide Details ▴
Paperback,
New
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology)
by Brodusch, Nicolas
2017, Springer
ISBN-13:
9789811044328
See Item Details ▾
Bonita
HIGH
Newport Coast,
CA,
USA
$152.64
Edition: 2017, Springer
Paperback,
New
Details: ISBN:
9811044325
ISBN-13:
9789811044328
Edition:
2018 edition
Publisher:
Springer
Published:
2017
Language:
English
Alibris ID:
18051042138
Shipping Options: Standard Shipping: $4.68
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New.
Hide Details ▴
