This detailed sourcebook provides an up-to-date description and unified treatment of the characterization techniques used in the semiconductor industry. It covers electrical, optical, electron- beam, ion-beam, X-ray and gamma ray methods. This information, until now scattered in journals and review papers, is presented in a unified manner with over 1300 references. It is also a valuable reference book on characterization methods.
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This detailed sourcebook provides an up-to-date description and unified treatment of the characterization techniques used in the semiconductor industry. It covers electrical, optical, electron- beam, ion-beam, X-ray and gamma ray methods. This information, until now scattered in journals and review papers, is presented in a unified manner with over 1300 references. It is also a valuable reference book on characterization methods.
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Seller's Description:
Good. There is either a name, note, or insciprtion on the inside cover. The pages are sun faded and slightly yellowing. We flipped through this book and didn't notice any notes or underlines. The cover has visible markings and wear. Some corner dings. The dust jacket shows normal wear and tear. The dust jacket has minor damage or small tear. This is a hardcover copy. Fast Shipping-Each order powers our free bookstore in Chicago and sending books to Africa!
