The first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough for a two-term graduate course. Organized for quick access so that it can be used as a handbook of specific characterization techniques. Processes are characterized through the use of test structures and the main techniques used within the semiconductor industry are thoroughly explained. While the majority of the book is devoted to widely used electrical ...
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The first book devoted to modern techniques of semiconductor characterization, this comprehensive guide to semiconductor measurement methods is detailed enough for a two-term graduate course. Organized for quick access so that it can be used as a handbook of specific characterization techniques. Processes are characterized through the use of test structures and the main techniques used within the semiconductor industry are thoroughly explained. While the majority of the book is devoted to widely used electrical characterization methods, the more specialized optical, chemical and physical methods are also covered. Contains over 1,300 references.
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Edition: 1990, Wiley-Interscience
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Good
Details: ISBN:
0471511048
ISBN-13:
9780471511045
Pages:
624
Publisher:
Wiley-Interscience
Published:
1990
Language:
English
Alibris ID:
17963549880
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Seller's Description: Good. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Edition: 1990, Wiley-Interscience
Hardcover,
Good
Details: ISBN:
0471511048
ISBN-13:
9780471511045
Pages:
624
Publisher:
Wiley-Interscience
Published:
1990
Language:
English
Alibris ID:
17945534216
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Edition: 1998, Wiley-Interscience
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Details: ISBN:
0471241393
ISBN-13:
9780471241393
Edition:
2nd Revised edition
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Wiley-Interscience
Published:
1998
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English
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17923848670
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Seller's Description: Pages and cover are intact. Used book in good and clean conditions. Limited notes marks and highlighting may be present. May show signs of normal shelf wear and bends on edges. Item may be missing CDs or access codes. May include library marks.
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Edition: 1990, Wiley-Interscience
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Details: ISBN:
0471511048
ISBN-13:
9780471511045
Pages:
624
Publisher:
Wiley-Interscience
Published:
1990
Language:
English
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10822160954
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Edition: 1990, Wiley-Interscience
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Details: ISBN:
0471511048
ISBN-13:
9780471511045
Pages:
624
Publisher:
Wiley-Interscience
Published:
1990
Language:
English
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11585510523
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Edition: 1990, Wiley-Interscience
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Available Copies: 2
Details: ISBN:
0471511048
ISBN-13:
9780471511045
Pages:
624
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Wiley-Interscience
Published:
1990
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English
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Edition: 1990, Wiley-Interscience
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0471511048
ISBN-13:
9780471511045
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624
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Wiley-Interscience
Published:
07/1990
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English
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16627898708
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Edition: 1998, Wiley-Interscience
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Details: ISBN:
0471241393
ISBN-13:
9780471241393
Edition:
2nd Revised edition
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Wiley-Interscience
Published:
1998
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English
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16421381656
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Edition: 2005, Wiley-IEEE Press
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Details: ISBN:
0471739065
ISBN-13:
9780471739067
Pages:
800
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3rd edition
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Wiley-IEEE Press
Published:
2005
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English
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17927118647
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Edition: 1990, Wiley-Interscience
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Details: ISBN:
0471511048
ISBN-13:
9780471511045
Pages:
624
Publisher:
Wiley-Interscience
Published:
1990
Language:
English
Alibris ID:
17903822251
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ISBN-13: 9780471739067
3rd edition
Hardcover
ISBN-13: 9780471241393
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Hardcover
ISBN-13: 9780471511045
Hardcover
All Editions of Semiconductor Material and Device Characterization
Books by Dieter K Schroder
