Systems, Models and Measures seeks to bridge the gap between the 'classical' and the newer technologies by constructing a systematic measurement framework for both. The authors use their experience as consultants in systems, software and quality engineering to take the subject from concept and theory, via strategy and procedure, to tools and applications. The book clarifies the key notions of system, model, measurement, product, process, specification and design. Practical examples demonstrate the 'architecture' of ...
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Systems, Models and Measures seeks to bridge the gap between the 'classical' and the newer technologies by constructing a systematic measurement framework for both. The authors use their experience as consultants in systems, software and quality engineering to take the subject from concept and theory, via strategy and procedure, to tools and applications. The book clarifies the key notions of system, model, measurement, product, process, specification and design. Practical examples demonstrate the 'architecture' of measurement schemes, extending them to object-oriented and subjective measurement. A detailed case study provides a measurement strategy for formal specifications, including Prolog, Z and VDM. The reader will be able to formulate problems in measurable terms, appraise and compare formal specifications, assess and enhance existing measurement practices, and devise measurement schemes for describing objective characteristics and expressing value judgements.
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Add this copy of Systems, Models and Measures to cart. $60.65, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 1993 by Springer.
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New. Print on demand Trade paperback (US). Glued binding. 335 p. Contains: Illustrations, black & white. Formal Approaches to Computing and Information Technology (F.
Add this copy of Systems, Models and Measures to cart. $65.38, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 1993 by Springer.
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