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- ISBN: 9783031442322
Edition
ISBN: 3031442326 /
ISBN-13: 9783031442322
- Book Details
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Hardcover,
New
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation
by Xia, Fangzhou, and Rangelow, Ivo W, and Youcef-Toumi, Kamal
2024, Springer
ISBN-13:
9783031442322
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Alibris
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$102.93
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- Edition:
- 2024, Springer
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Hardcover,
New
- Available Copies: 2
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- Details:
- ISBN:
3031442326
- ISBN-13:
9783031442322
- Edition:
2024 edition
- Publisher:
Springer
- Published:
2024
- Language:
English
- Alibris ID:
17976255245
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- Seller's Description:
- New. Sewn binding. Cloth over boards. 366 p. Contains: Illustrations, black & white, Illustrations, color, Tables, color.
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