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- ISBN: 9783030092986
Edition
ISBN: 3030092984 /
ISBN-13: 9783030092986
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Paperback,
New
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
by Sadewasser, Sascha (Editor), and Glatzel, Thilo (Editor)
2019, Springer
ISBN-13:
9783030092986
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Alibris
BEST
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$215.66
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- Edition:
- 2019, Springer
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Paperback,
New
- Available Copies: 10+
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- Details:
- ISBN:
3030092984
- ISBN-13:
9783030092986
- Publisher:
Springer
- Published:
2019
- Language:
English
- Alibris ID:
15158873096
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- Seller's Description:
- New. Print on demand Trade paperback (US). Glued binding. 521 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, color. Springer Surface Sciences, 65.
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