- Books
- ISBN: 9783030092986
Edition
ISBN: 3030092984 /
ISBN-13: 9783030092986
- Book Details
- Seller
-
-
Paperback,
New
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
by Sadewasser, Sascha (Editor), and Glatzel, Thilo (Editor)
2019, Springer
ISBN-13:
9783030092986
See Item Details ▾
|
Alibris
BEST
NV, USA
|
$215.66
|
|
- Edition:
- 2019, Springer
-
Paperback,
New
- Available Copies: 10+
|
- Details:
- ISBN:
3030092984
- ISBN-13:
9783030092986
- Publisher:
Springer
- Published:
2019
- Language:
English
- Alibris ID:
15158873096
|
- Shipping Options:
- Standard Shipping: $4.61
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New. Print on demand Trade paperback (US). Glued binding. 521 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, color. Springer Surface Sciences, 65.
|
|
Hide Details ▴ |
|
|
|
|