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- ISBN: 9781849968201
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ISBN: 1849968209 /
ISBN-13: 9781849968201
- Book Details
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- Edition:
- 2010, Springer
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Paperback,
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- Available Copies: 10+
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- Details:
- ISBN:
1849968209
- ISBN-13:
9781849968201
- Publisher:
Springer
- Published:
2010
- Language:
English
- Alibris ID:
17383405501
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- Seller's Description:
- New. Trade paperback (US). Glued binding. 298 p. Contains: Tables, black & white. Engineering Materials and Processes.
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Paperback,
New
Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion
by Seebauer, Edmund G, and Kratzer, Meredith C
2010, Springer
ISBN-13:
9781849968201
See Item Details ▾
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Alibris
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NV, USA
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$168.69
$199.99
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- Edition:
- 2010, Springer
-
Paperback,
New
- Available Copies: 10+
|
- Details:
- ISBN:
1849968209
- ISBN-13:
9781849968201
- Publisher:
Springer
- Published:
2010
- Language:
English
- Alibris ID:
12174058885
|
- Shipping Options:
- Standard Shipping: $4.78
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New. Trade paperback (US). Glued binding. 298 p. Contains: Tables, black & white. Engineering Materials and Processes.
|
|
Hide Details ▴ |
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