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X-Ray Diffraction: Structure, Principles & Applications - Shih, Kaimin (Editor)
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An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial ...

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X-Ray Diffraction: Structure, Principles & Applications 2013, Nova Science Publishers Inc, New York

ISBN-13: 9781628085914

Hardcover