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Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials: Volume 1184 (Mrs Proceedings)
by P. Moeck, S. Hovmoller, S. Nicolopoulos, S. Rouvimov, V. Petkov, M. Gateshki, P. Fraundorf
2009, Cambridge University Press
ISBN-13:
9781605111575
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Edition:
2009, Cambridge University Press
Hardcover
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ISBN:
1605111570
ISBN-13:
9781605111575
Publisher:
Cambridge University Press
Published:
2009
Language:
English
Alibris ID:
17763541709
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211 pp., Hardcover, new. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Edition:
2009, Cambridge University Press
Hardcover,
Good
Details:
ISBN:
1605111570
ISBN-13:
9781605111575
Publisher:
Cambridge University Press
Published:
2009
Language:
English
Alibris ID:
17865150818
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Good. Former library book; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials
by Peter Moeck, Portland State Universitysven Hovmöller, Stockholms Universitetstavros Nicolopoulos, Nanomegas Sprl,...
2009, Materials Research Society
ISBN-13:
9781605111575
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Edition:
2009, Materials Research Society
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ISBN:
1605111570
ISBN-13:
9781605111575
Publisher:
Materials Research Society
Published:
2009
Language:
English
Alibris ID:
18029341074
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Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials: Volume 1184 (Mrs Proceedings)
2009, Cambridge University Press
ISBN-13:
9781605111575
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Bonita
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Newport Coast,
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$29.36
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Edition:
2009, Cambridge University Press
Hardcover,
Good
Details:
ISBN:
1605111570
ISBN-13:
9781605111575
Publisher:
Cambridge University Press
Published:
2009
Language:
English
Alibris ID:
17869989228
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Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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