- Books
- ISBN: 9781441952691
Edition
ISBN: 1441952691 /
ISBN-13: 9781441952691
- Book Details
- Seller
-
-
|
- Edition:
- 2011, Springer-Verlag New York Inc.
-
Paperback,
New
- Available Copies: 10+
|
- Details:
- ISBN:
1441952691
- ISBN-13:
9781441952691
- Publisher:
Springer-Verlag New York Inc.
- Published:
2011
- Language:
English
- Alibris ID:
17383548710
|
- Shipping Options:
- Standard Shipping: $4.73
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New. 388 p. Frontiers in Electronic Testing , 29. XX, 388 p. Intended for professional and scholarly audience.
|
|
|
| Hide Details ▴ |
-
|
|
- Edition:
- 2011, Springer-Verlag New York Inc.
-
Paperback,
New
- Available Copies: 10+
|
- Details:
- ISBN:
1441952691
- ISBN-13:
9781441952691
- Publisher:
Springer-Verlag New York Inc.
- Published:
2011
- Language:
English
- Alibris ID:
14701704368
|
- Shipping Options:
- Standard Shipping: $4.73
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New. Print on demand Frontiers in Electronic Testing . XX, 388 p. Intended for professional and scholarly audience.
|
|
|
| Hide Details ▴ |
-
|
Paperback,
Good
Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing, 29)
by Larsson, Erik
2011, Springer
ISBN-13:
9781441952691
See Item Details ▾
|
Bonita
HIGH
Newport Coast,
CA,
USA
|
$202.58
|
|
|
- Edition:
- 2011, Springer
-
Paperback,
Good
|
- Details:
- ISBN:
1441952691
- ISBN-13:
9781441952691
- Publisher:
Springer
- Published:
2011
- Language:
English
- Alibris ID:
18128584258
|
- Shipping Options:
- Standard Shipping: $4.73
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
|
|
|
| Hide Details ▴ |
|
|
|
|
