Books
ISBN: 9781441922090
Edition
ISBN:
1441922091 /
ISBN-13:
9781441922090
Book Details
Seller
Sort
U.K./EUR Sellers
Price: Low to High
Price: High to Low
Condition
Condition: Reverse
Pub Date
Pub Date: Reverse
Sellers Near Me
Paperback,
New
Scanning Microscopy for Nanotechnology: Techniques and Applications
by Zhou, Weilie (Editor), and Wang, Zhong Lin (Editor)
2010, Springer
ISBN-13:
9781441922090
See Item Details ▾
Alibris
BEST
NV, USA
$243.84
Add to Basket
Add this copy of Scanning Microscopy for Nanotechnology: Techniques and to cart. $243.84, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2010 by Springer.
Edition: 2010, Springer
Paperback,
New
Available Copies: 10+
Details: ISBN:
1441922091
ISBN-13:
9781441922090
Publisher:
Springer
Published:
2010
Language:
English
Alibris ID:
11794619063
Shipping Options: Standard Shipping: $4.49
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Print on demand Trade paperback (US). Glued binding. 522 p. Contains: Illustrations, black & white.
Hide Details ▴
Paperback,
New
Scanning Microscopy for Nanotechnology
2010, Springer
ISBN-13:
9781441922090
See Item Details ▾
Media Smart
HIGH
Hawthorne,
CA,
USA
$303.19
Add to Basket
Add this copy of Scanning Microscopy for Nanotechnology to cart. $303.19, new condition, Sold by Media Smart rated 4.0 out of 5 stars, ships from Hawthorne, CA, UNITED STATES, published 2010 by Springer.
Edition: 2010, Springer
Paperback,
New
Available Copies: 2
Details: ISBN:
1441922091
ISBN-13:
9781441922090
Publisher:
Springer
Published:
2010
Language:
English
Alibris ID:
18177797246
Shipping Options: Standard Shipping: $4.49
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. P 538.
Hide Details ▴
