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ISBN: 9780521031707
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0521031702 /
ISBN-13:
9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
by Browning, Nigel D (Editor), and Pennycook, Stephen J (Editor)
2006, Cambridge University Press
ISBN-13:
9780521031707
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Add this copy of Characterization of High Tc Materials and Devices by to cart. $55.35, new condition, Sold by Booksplease rated 3.0 out of 5 stars, ships from Southport, MERSEYSIDE, UNITED KINGDOM, published 2006 by Cambridge University Press.
Edition: 2006, Cambridge University Press
Paperback,
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Details: ISBN:
0521031702
ISBN-13:
9780521031707
Publisher:
Cambridge University Press
Published:
2006
Language:
English
Alibris ID:
17489370438
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Seller's Description: New. Trade paperback (US). Glued binding. 408 p. Contains: Unspecified, Halftones, Tables, Line drawings.
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Paperback,
New
Characterization of High Tc Materials and Devices by Electron Microscopy
by Browning, Nigel D (Editor), and Pennycook, Stephen J (Editor)
2006, Cambridge University Press
ISBN-13:
9780521031707
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Edition: 2006, Cambridge University Press
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Available Copies: 10+
Details: ISBN:
0521031702
ISBN-13:
9780521031707
Publisher:
Cambridge University Press
Published:
2006
Language:
English
Alibris ID:
11298837583
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Seller's Description: New. Trade paperback (US). Glued binding. 408 p. Contains: Unspecified, Halftones, Tables, Line drawings.
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Characterization of High Tc Materials and Devices By Electron Microscopy
by Browning, Nigel D.
2006, Cambridge University Press
ISBN-13:
9780521031707
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Newport Coast,
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$90.77
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Add this copy of Characterization of High Tc Materials and Devices By to cart. $90.77, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2006 by Cambridge University Press.
Edition: 2006, Cambridge University Press
Paperback,
Good
Details: ISBN:
0521031702
ISBN-13:
9780521031707
Publisher:
Cambridge University Press
Published:
2006
Language:
English
Alibris ID:
18136908256
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