Edition
ISBN:
0306472929 /
ISBN-13:
9780306472923
Book Details
Seller
Sort
U.K./EUR Sellers
Price: Low to High
Price: High to Low
Condition
Condition: Reverse
Pub Date
Pub Date: Reverse
Sellers Near Me
Hardcover,
Good
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael...
2007, Springer
ISBN-13:
9780306472923
See Item Details ▾
TEXTSHUB
BEST
Franklin Lakes,
NJ,
USA
$118.84
Add to Basket
Add this copy of Scanning Electron Microscopy and X-Ray Microanalysis: to cart. $118.84, good condition, Sold by TEXTSHUB rated 5.0 out of 5 stars, ships from Franklin Lakes, NJ, UNITED STATES, published 2007 by Springer.
Edition: 2007, Springer
Hardcover,
Good
Available Copies: 2
Details: ISBN:
0306472929
ISBN-13:
9780306472923
Edition:
3rd Corrected 2003
Publisher:
Springer
Published:
04/2007
Language:
English
Alibris ID:
17754191434
Shipping Options: Standard Shipping: $4.52
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Good. US Edition Textbook, May Have Highlights, Notes and/or Underlining, BOOK ONLY-NO ACCESS CODE, NO CD, Ships with Emailed Tracking from USA.
Hide Details ▴
Very Good
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein Joseph, Echlin Patrick, Joy David C., Lifshin Eric, Lyman Charles E., Michael J. R., Newbury Dale E., Sawyer Linda
2003, Springer
ISBN-13:
9780306472923
See Item Details ▾
FirstClassBooks
HIGH
Little Rock,
AR,
USA
$81.38
$119.99
Add to Basket
Add this copy of Scanning Electron Microscopy and X-Ray Microanalysis: to cart. $81.38, very good condition, Sold by FirstClassBooks rated 4.0 out of 5 stars, ships from Little Rock, AR, UNITED STATES, published 2003 by Springer.
Details: ISBN:
0306472929
ISBN-13:
9780306472923
Edition:
3rd Corrected 2003
Publisher:
Springer
Published:
2003
Language:
English
Alibris ID:
18214388833
Shipping Options: Standard Shipping: $4.52
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Very Good. Used books cannot guarantee unused access codes or working CD's! !
Hide Details ▴
Hardcover,
Good
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph
2003, Springer
ISBN-13:
9780306472923
See Item Details ▾
Bonita
HIGH
Newport Coast,
CA,
USA
$115.42
Add to Basket
Add this copy of Scanning Electron Microscopy and X-Ray Microanalysis: to cart. $115.42, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2003 by Springer.
Edition: 2003, Springer
Hardcover,
Good
Details: ISBN:
0306472929
ISBN-13:
9780306472923
Edition:
3rd Corrected 2003
Publisher:
Springer
Published:
2003
Language:
English
Alibris ID:
17905276721
Shipping Options: Standard Shipping: $4.52
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Hide Details ▴
