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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael...
2003, Springer
ISBN-13:
9780306472923
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- ISBN:
0306472929
- ISBN-13:
9780306472923
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3rd Corrected 2003
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Springer
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01/2003
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17817115754
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael...
2007, Springer
ISBN-13:
9780306472923
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- ISBN:
0306472929
- ISBN-13:
9780306472923
- Edition:
3rd Corrected 2003
- Publisher:
Springer
- Published:
04/2007
- Language:
English
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17754191434
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- ISBN:
0306472929
- ISBN-13:
9780306472923
- Edition:
3rd Corrected 2003
- Publisher:
Springer
- Published:
2003
- Language:
English
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17905276721
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- ISBN:
0306472929
- ISBN-13:
9780306472923
- Edition:
3rd Corrected 2003
- Publisher:
Springer
- Published:
2003
- Language:
English
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17905276722
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Michael, J.R.; Sawyer,...
2007, Springer
ISBN-13:
9780306472923
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- Edition:
- 2007, Springer
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- Available Copies: 2
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- Details:
- ISBN:
0306472929
- ISBN-13:
9780306472923
- Edition:
3rd Corrected 2003
- Publisher:
Springer
- Published:
04/2007
- Language:
English
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18112317716
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