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0306472929 /
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael...
2003, Springer
ISBN-13:
9780306472923
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0306472929
ISBN-13:
9780306472923
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Scanning Electron Microscopy and X-Ray Microanalysis
by Linda Sawyer David C. Joy J.R. Michael Linda C. Sawyer Eric Lifshin Patrick Echlin Charles E. Lyman D.C. Joy Dale E. Newbury...
2003, Springer
ISBN-13:
9780306472923
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Details: ISBN:
0306472929
ISBN-13:
9780306472923
Edition:
3rd Corrected 2003
Publisher:
Springer
Published:
2003
Language:
English
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18182879856
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph
2003, Springer
ISBN-13:
9780306472923
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Edition: 2003, Springer
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Available Copies: 2
Details: ISBN:
0306472929
ISBN-13:
9780306472923
Edition:
3rd Corrected 2003
Publisher:
Springer
Published:
2003
Language:
English
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17905276722
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