Edition
ISBN: 0306421402 /
ISBN-13: 9780306421402
- Book Details
- Seller
-
-
|
Hardcover,
New
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
by Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E.
1986, Plenum Press
ISBN-13:
9780306421402
See Item Details ▾
|
GridFreed
BEST
North Las Vegas,
NV,
USA
|
$86.90
$199.99
|
|
- Edition:
- 1986, Plenum Press
-
Hardcover,
New
|
- Details:
- ISBN:
0306421402
- ISBN-13:
9780306421402
- Edition:
1986 edition
- Publisher:
Plenum Press
- Published:
03/1986
- Language:
English
- Alibris ID:
17817109885
|
- Shipping Options:
- Standard Shipping: $4.65
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New. Size: 98x17x147; New. In shrink wrap. Looks like an interesting title!
|
|
|
| Hide Details ▴ |
-
|
|
- Edition:
- 1986, Springer
-
New
|
- Details:
- ISBN:
0306421402
- ISBN-13:
9780306421402
- Edition:
1986 edition
- Publisher:
Springer
- Published:
1986
- Language:
English
- Alibris ID:
17945115425
|
- Shipping Options:
- Standard Shipping: $4.65
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- Brand New. New Book Original US edition, We Ship to PO BOX Address also.
|
|
|
| Hide Details ▴ |
-
|
|
- Edition:
- 1986, Springer
-
New
|
- Details:
- ISBN:
0306421402
- ISBN-13:
9780306421402
- Edition:
1986 edition
- Publisher:
Springer
- Published:
1986
- Language:
English
- Alibris ID:
18083273362
|
- Shipping Options:
- Standard Shipping: $4.65
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New, US edition. Satisfaction guaranteed! !
|
|
|
| Hide Details ▴ |
-
|
|
- Edition:
- 1986, Springer
-
New
|
- Details:
- ISBN:
0306421402
- ISBN-13:
9780306421402
- Edition:
1986 edition
- Publisher:
Springer
- Published:
1986
- Language:
English
- Alibris ID:
18014259269
|
- Shipping Options:
- Standard Shipping: $4.65
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New, US edition. Satisfaction guaranteed! !
|
|
|
| Hide Details ▴ |
-
|
|
- Edition:
- 1986, Plenum Press
-
Hardcover,
New
|
- Details:
- ISBN:
0306421402
- ISBN-13:
9780306421402
- Edition:
1986 edition
- Publisher:
Plenum Press
- Published:
1986
- Language:
English
- Alibris ID:
17850519105
|
- Shipping Options:
- Standard Shipping: $4.65
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New.
|
|
|
| Hide Details ▴ |
-
|
Hardcover,
New
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
by Dale E. Newbury David C. Joy Joseph Goldstein C.E. Fiori Patrick Echlin
1986, Springer
ISBN-13:
9780306421402
See Item Details ▾
|
Media Smart
HIGH
Hawthorne,
CA,
USA
|
$181.12
|
|
|
- Edition:
- 1986, Springer
-
Hardcover,
New
|
- Details:
- ISBN:
0306421402
- ISBN-13:
9780306421402
- Edition:
1986 edition
- Publisher:
Springer
- Published:
1986
- Language:
English
- Alibris ID:
16666016796
|
- Shipping Options:
- Standard Shipping: $4.65
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New. P xii + 454.
|
|
|
| Hide Details ▴ |
|
|
|
|
