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Long-Term Reliability of Nanometer Vlsi Systems
by Saman Kiamehr
2020, Springer
ISBN-13:
9783030261740
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Details: ISBN:
3030261743
ISBN-13:
9783030261740
Edition:
2019 edition
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Springer
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2020
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English
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Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
by Tan, Sheldon, and Tahoori, Mehdi, and Kim, Taeyoung
2020, Springer
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9783030261740
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Add this copy of Long-Term Reliability of Nanometer VLSI Systems: to cart. $168.69, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2020 by Springer.
Edition: 2020, Springer
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Available Copies: 10+
Details: ISBN:
3030261743
ISBN-13:
9783030261740
Edition:
2019 edition
Publisher:
Springer
Published:
2020
Language:
English
Alibris ID:
16346677430
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Seller's Description: New. Print on demand Trade paperback (US). Glued binding. 460 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color.
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