|
Hardcover,
Fair
Advanced Data Storage Materials and Characterization Techniques: Symposia Held December 1-4, 2003, Boston, Massachusetts, U.S.a.
by Joachim W. Ahner; Jeremy Levy; Lambertus Hesselink; Andrei Mijiritskii (Editors)
2004, Materials Research Society
ISBN-13:
9781558997417
See Item Details ▾
|
HaroldsBooks
HIGH
Corydon,
IA,
USA
|
$25.00
$37.46
|
