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ISBN: 1107409489 /
ISBN-13: 9781107409484
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Materials Reliability in Microelectronics III: Volume 309
by Rodbell, Kenneth P. (Editor), and Filter, William F. (Editor), and Frost, Harold J. (Editor)
2014, Cambridge University Press
ISBN-13:
9781107409484
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- Edition:
- 2014, Cambridge University Press
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- Details:
- ISBN:
1107409489
- ISBN-13:
9781107409484
- Publisher:
Cambridge University Press
- Published:
2014
- Language:
English
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17383669784
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- Seller's Description:
- New. Trade paperback (US). 514 p. MRS Proceedings . Intended for college/higher education audience. Intended for professional and scholarly audience.
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Paperback,
New
Materials Reliability in Microelectronics III: Volume 309
by Rodbell, Kenneth P. (Editor), and Filter, William F. (Editor), and Frost, Harold J. (Editor)
2014, Cambridge University Press
ISBN-13:
9781107409484
See Item Details ▾
|
Alibris
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NV, USA
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$40.93
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- Edition:
- 2014, Cambridge University Press
-
Paperback,
New
- Available Copies: 10+
|
- Details:
- ISBN:
1107409489
- ISBN-13:
9781107409484
- Publisher:
Cambridge University Press
- Published:
2014
- Language:
English
- Alibris ID:
13203081448
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- Standard Shipping: $4.73
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- Seller's Description:
- New. Print on demand Trade paperback (US). MRS Proceedings . Intended for professional and scholarly audience.
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- Edition:
- 2014, Cambridge University Press
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- Details:
- ISBN:
1107409489
- ISBN-13:
9781107409484
- Publisher:
Cambridge University Press
- Published:
2014
- Language:
English
- Alibris ID:
17556142248
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