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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
by Lall, Pradeep, and Pecht, Michael, and Hakim, Edward B
1997, CRC Press
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1997, CRC Press
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Influence of Temperature on Microelectronics and System Reliability: a Physics of Failure Approach (Electronic Packaging)
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1997, CRC Press
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1997, CRC Press
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Influence of Temperature on Microelectronics and System Reliability: a Physics of Failure Approach (Electronic Packaging Series)
by Hakim, Edward B.; Pecht, Michael G. & Lall, Pradeep
1997, CRC Press
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