James W Mayer

James W. Mayer is the Galvin Professor of Science and Engineering and Regents Professor at Arizona State University. He has investigated thin film phenomena and metallization for integrated circuits over the pasttwo decades. He has coauthored and coedited books on thin films, silicides and ion implantation. Previously he was the F.N. Bard Professor of Materials Science at Cornell University and before this, Professor of Electrical Engineering at the California Institute of Technology. He...See more

James W. Mayer is the Galvin Professor of Science and Engineering and Regents Professor at Arizona State University. He has investigated thin film phenomena and metallization for integrated circuits over the pasttwo decades. He has coauthored and coedited books on thin films, silicides and ion implantation. Previously he was the F.N. Bard Professor of Materials Science at Cornell University and before this, Professor of Electrical Engineering at the California Institute of Technology. He received his Ph.D. in Physics at Purdue University and was a member of the technical staff at Hughes Research Laboratories. He is known for his work on nuclear particle detectors and Rutherford backscattering analysis. He is a Fellow of the IEEE and the American Physical Society and a member of the National Academy of Engineering. Dr. Terry L. Alford is a professor of materials engineering in the Department of Chemical and Materials Engineering at Arizona State University. His book, Nanoscale Thin Film Analysis, co-authored with L. Feldman and J. Mayer will be published by Springer in March 2006. Dr. Alford received his Ph.D. from Cornell University and was employed by Texas Instruments. He has had extensive consulting experience with Philips Semiconductors, Freescale Semiconductors, and Motorola. He has published extensively on the properties of thin films and the use of analysis techniques to characterize the films. Daniel Adams is a professor of Physics in the Department of Physics at the University of the Western Cape, South Africa. He has extensively investigated silver and copper metallization for the past ten years. He was the leading author of a review article, entitled: "Encapsulated Silver for Integrated Circuit metallization," published in Materials Science and Engineering: R. Reports, 40, 207-250(2003). Apart from an extensive list of publications on thin film phenomena and metallization he also co-authored a chapter on "Spectroscopy and Spectrometry" in the Encyclopedia of Condensed Matter Physics, May 2005. Professor Adams received his PhD in Materials Engineering from Arizona State University, USA. See less