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  • Secondary Ion Mass Spectrometry Sims II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (Sims II) Stanford University, Stanford, California, USA August 27-31, 1979

Secondary Ion Mass Spectrometry Sims II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (Sims II) Stanford University, Stanford, California, USA August 27-31, 1979

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Secondary Ion Mass Spectrometry Sims II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (Sims II) Stanford University, Stanford, California, USA August 27-31, 1979 - Benninghoven, A (Editor), and Evans, C a Jr (Editor), and Powell, R a (Editor)
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This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.

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Secondary Ion Mass Spectrometry Sims II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (Sims II) Stanford University, Stanford, California, USA August 27-31, 1979 2011, Springer, Berlin, Heidelberg

ISBN-13: 9783642618734

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