Secondary Ion Mass Spectrometry Sims II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (Sims II) Stanford University, Stanford, California, USA August 27-31, 1979
Secondary Ion Mass Spectrometry Sims II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (Sims II) Stanford University, Stanford, California, USA August 27-31, 1979
This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.
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This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.
Read Less
Add this copy of Secondary Ion Mass Spectrometry Sims II: Proceedings of to cart. $112.32, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2011 by Springer.
Add this copy of Secondary Ion Mass Spectrometry Sims II: Proceedings of to cart. $82.25, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2011 by Springer.
