Based on the proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry, held in Monterey, California, September 3-8, 1989. Covers fundamental, complementary and enhancement techniques, comparative SIMS, geology, biology, polymers, metallurgy, profiling and semiconductors. Describes a valuable methodology (SIMS) for characterizing solid surfaces and presents numerous analytical applications.
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Based on the proceedings of the Seventh International Conference on Secondary Ion Mass Spectrometry, held in Monterey, California, September 3-8, 1989. Covers fundamental, complementary and enhancement techniques, comparative SIMS, geology, biology, polymers, metallurgy, profiling and semiconductors. Describes a valuable methodology (SIMS) for characterizing solid surfaces and presents numerous analytical applications.
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Add this copy of Secondary Ion Mass Spectrometry: Sims VII to cart. $16.47, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1990 by Wiley.
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