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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Sadewasser, Sascha (Editor), and Glatzel, Thilo (Editor)
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Presents the applications of Kelvin probe force microscopy in nanotechnology Provides an in-depth description of a variety of theoretical and experimental aspects of the technique Includes contributions by the leading experts in the field

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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization 2019, Springer, Cham

ISBN-13: 9783030092986

Trade paperback

Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization 2018, Springer, Cham

ISBN-13: 9783319756868

2018 edition

Hardcover