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Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials: Volume 1184 - Moeck, Peter (Editor), and Hovmöller, Sven (Editor), and Nicolopoulos, Stavros (Editor)
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This book combines the proceedings of Symposium GG, Electron Crystallography for Materials Research, and Symposium HH, Quantitative Characterization of Nanostructured Materials, both from the 2009 MRS Spring Meeting in San Francisco. Papers from Symposium GG focus on the fundamentals and recent progress in electron crystallography and associated strategies for structural fingerprinting of nanocrystals. Some consensus was reached regarding precession electron diffraction and electron diffraction tomography as instrumental ...

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Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials: Volume 1184 2014, Cambridge University Press, Cambridge

ISBN-13: 9781107408203

Trade paperback

Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials: Volume 1184 2009, Materials Research Society, New York

ISBN-13: 9781605111575

Hardcover