A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.
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A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.
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Edition: 2006, Cambridge University Press
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0521031702
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9780521031707
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408
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Cambridge University Press
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2006
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English
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Edition: 2006, Cambridge University Press
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Details: ISBN:
0521031702
ISBN-13:
9780521031707
Pages:
408
Publisher:
Cambridge University Press
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2006
Language:
English
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17383122142
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Seller's Description: New. Trade paperback (US). Glued binding. 408 p. Contains: Unspecified, Halftones, Tables, Line drawings.
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Edition: 2006, Cambridge University Press
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Details: ISBN:
0521031702
ISBN-13:
9780521031707
Pages:
408
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Cambridge University Press
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2006
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English
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17489370438
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Edition: 2006, Cambridge University Press
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Available Copies: 10+
Details: ISBN:
0521031702
ISBN-13:
9780521031707
Pages:
408
Publisher:
Cambridge University Press
Published:
2006
Language:
English
Alibris ID:
11298837583
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Edition: 2006, Cambridge University Press
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0521031702
ISBN-13:
9780521031707
Pages:
408
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Cambridge University Press
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2006
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English
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Edition: 2000, Cambridge University Press
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052155490X
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9780521554909
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2000
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Edition: 2000, Cambridge University Press
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052155490X
ISBN-13:
9780521554909
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2000
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Edition: 2000, Cambridge University Press
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052155490X
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9780521554909
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406
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Cambridge University Press
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2000
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Edition: 2000, Cambridge University Press
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Details: ISBN:
052155490X
ISBN-13:
9780521554909
Pages:
406
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Cambridge University Press
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2000
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English
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Edition: 2000, Cambridge University Press
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Details: ISBN:
052155490X
ISBN-13:
9780521554909
Pages:
406
Publisher:
Cambridge University Press
Published:
2000
Language:
English
Alibris ID:
17563825857
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ISBN-13: 9780521031707
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All Editions of Characterization of High Tc Materials and Devices by Electron Microscopy
Books by Nigel D Browning
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