Hot-Carrier Reliability of...
Yusuf Leblebici,
Sung-Mo (Steve) Kang
Buy from $215.66
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Yield and Variability...
Jian Cheng Zhang,
M a Styblinski
Buy from $12.45
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From Coherent Tunneling to...
Alois Würger
Buy from $60.65
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Transition-Metal Defects in...
Michael Steger
Buy from $112.32
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Digital Noise Monitoring of...
Telman Aliev
Buy from $112.32
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Defects in Sio2 and Related...
Gianfranco Pacchioni (Editor),
Linards Skuja (Editor)
Buy from $215.66
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Shopping for Safety: Special...
Committee for Study of Consumer Automotive Safety Information,
National Academy of Sciences (Other primary creator)
Buy from $76.86
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Latchup in CMOS Technology:...
R.R. Troutman
Buy from $112.32
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Understanding Housing Defects
Duncan Marshall,
Derek Worthing
Buy from $9.46
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Photoionization of Polyvalent...
Doris Moncke
Buy from $7.41
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Chloride Removal...
Jack Bennett,
Thomas J Schue
Buy from $66.95
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Hydrogen in Crystalline...
Stephen J Pearton,
James W Corbett
Buy from $62.93
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Colour Centres and...
Peter David Townsend,
John Clive Kelly
Buy from $38.05
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Building Surveys and Reports
Edward A. Noy
Buy from $5.22
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Building Surveys and Reports
Edward A Noy
Buy from $4.07
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