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ISBN: 364279680X /
ISBN-13: 9783642796807
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Optical Characterization of Epitaxial Semiconductor Layers
by Bauer, Günther (Editor), and Richter, Wolfgang (Editor)
2011, Springer
ISBN-13:
9783642796807
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- Edition:
- 2011, Springer
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- Details:
- ISBN:
364279680X
- ISBN-13:
9783642796807
- Publisher:
Springer
- Published:
2011
- Language:
English
- Alibris ID:
11399188497
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- New. Print on demand Trade paperback (US). Glued binding. 429 p.
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- Edition:
- 2011, Springer
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Paperback,
New
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- Details:
- ISBN:
364279680X
- ISBN-13:
9783642796807
- Publisher:
Springer
- Published:
2011
- Language:
English
- Alibris ID:
17964214830
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- Shipping Options:
- Standard Shipping: $4.77
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