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Scanning Electron Microscopy and X-Ray Microanalysis
by Goldstein, Joseph I, and Newbury, Dale E, and Michael, Joseph R
2017, Springer
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Scanning Electron Microscopy and X-Ray Microanalysis
by Goldstein, Joseph I., Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M., Scott, John Henry J., Joy, David C.
2017, Springer
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149396674X
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149396674X
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