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Details: ISBN:
1441923071
ISBN-13:
9781441923073
Edition:
2nd edition 2004
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Springer
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12/2011
Language:
English
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
by Pietsch, Ullrich, and Holy, Vaclav, and Baumbach, Tilo
2011, Springer-Verlag New York Inc.
ISBN-13:
9781441923073
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Details: ISBN:
1441923071
ISBN-13:
9781441923073
Edition:
2nd edition 2004
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Springer-Verlag New York Inc.
Published:
2011
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English
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12251020596
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
by Pietsch, Ullrich, and Holy, Vaclav, and Baumbach, Tilo
2011, Springer-Verlag New York Inc.
ISBN-13:
9781441923073
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Details: ISBN:
1441923071
ISBN-13:
9781441923073
Edition:
2nd edition 2004
Publisher:
Springer-Verlag New York Inc.
Published:
2011
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English
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
by Pietsch, Ullrich, and Holy, Vaclav, and Baumbach, Tilo
2011, Springer-Verlag New York Inc.
ISBN-13:
9781441923073
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Details: ISBN:
1441923071
ISBN-13:
9781441923073
Edition:
2nd edition 2004
Publisher:
Springer-Verlag New York Inc.
Published:
2011
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
by Pietsch, Ullrich
2011, Springer
ISBN-13:
9781441923073
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Details: ISBN:
1441923071
ISBN-13:
9781441923073
Edition:
2nd edition 2004
Publisher:
Springer
Published:
2011
Language:
English
Alibris ID:
17335194142
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
by Pietsch, Ullrich
2011, Springer
ISBN-13:
9781441923073
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1441923071
ISBN-13:
9781441923073
Edition:
2nd edition 2004
Publisher:
Springer
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2011
Language:
English
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17335194143
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