Add this copy of Testing for Small-Delay Defects in Nanoscale CMOS to cart. $103.74, new condition, Sold by Booksplease rated 3.0 out of 5 stars, ships from Southport, MERSEYSIDE, UNITED KINGDOM, published 2017 by CRC Press.
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Seller's Description:
New. Contains: Illustrations, black & white. Devices, Circuits, and Systems . Includes: illustrations, black & white. Intended for college/higher education audience.
