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ISBN: 9781107120686
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1107120683 /
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9781107120686
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Measurement Techniques for Radio Frequency Nanoelectronics (the Cambridge Rf and Microwave Engineering Series)
by Wallis, T. Mitch; Kabos, Pavel
2017, Cambridge University Press
ISBN-13:
9781107120686
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Edition:
2017, Cambridge University Press
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ISBN:
1107120683
ISBN-13:
9781107120686
Edition:
First Edition
Publisher:
Cambridge University Press
Published:
2017
Language:
English
Alibris ID:
17852487443
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Like New. Size: 7x0x10; A firm and square hardback with strong joints, and sharp corners just showing a few very minor cosmetic rubs. Hence a non-text page has a small 'damaged' stamp. Despite such this book is actually in nearly new condition. Thus the contents are crisp, fresh and tight. Also, no pen-marks and not from a library so no such stamps or labels. Now offered for sale at a very sensible price.
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Edition:
2017, Cambridge University Press
New
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ISBN:
1107120683
ISBN-13:
9781107120686
Publisher:
Cambridge University Press
Published:
2017
Language:
English
Alibris ID:
18101507261
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Brand New. New Book Original US edition, We Ship to PO BOX Address also.
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Edition:
2017, Cambridge University Press
New
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ISBN:
1107120683
ISBN-13:
9781107120686
Publisher:
Cambridge University Press
Published:
2017
Language:
English
Alibris ID:
18100709663
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New, US edition. Satisfaction guaranteed! !
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Measurement Techniques for Radio Frequency Nanoelectronics (the Cambridge Rf and Microwave Engineering Series)
by Wallis, T. Mitch
2017, Cambridge University Press
ISBN-13:
9781107120686
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Edition:
2017, Cambridge University Press
Hardcover,
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ISBN:
1107120683
ISBN-13:
9781107120686
Publisher:
Cambridge University Press
Published:
2017
Language:
English
Alibris ID:
17315820110
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Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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Edition:
2017, Cambridge University Press
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ISBN:
1107120683
ISBN-13:
9781107120686
Publisher:
Cambridge University Press
Published:
2017
Language:
English
Alibris ID:
18014256028
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New, US edition. Satisfaction guaranteed! !
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Edition:
2017, Cambridge University Press
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ISBN:
1107120683
ISBN-13:
9781107120686
Publisher:
Cambridge University Press
Published:
2017
Language:
English
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18031983672
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Edition:
2017, Cambridge University Press
New
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ISBN:
1107120683
ISBN-13:
9781107120686
Publisher:
Cambridge University Press
Published:
2017
Language:
English
Alibris ID:
17945105875
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Brand New. New Book Original US edition, We Ship to PO BOX Address also.
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Measurement Techniques for Radio Frequency Nanoelectronics the Cambridge Rf and Microwave Engineering Series
by Wallis, T. Mitch
2017, Cambridge University Press
ISBN-13:
9781107120686
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2017, Cambridge University Press
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ISBN:
1107120683
ISBN-13:
9781107120686
Publisher:
Cambridge University Press
Published:
9/14/2017 12: 00: 00 AM
Language:
English
Alibris ID:
18099386454
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PLEASE NOTE, WE DO NOT SHIP TO DENMARK. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Please note we cannot offer an expedited shipping service from the UK.
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Measurement Techniques for Radio Frequency Nanoelectronics (the Cambridge Rf and Microwave Engineering Series)
2017, Cambridge University Press CUP
ISBN-13:
9781107120686
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Hawthorne,
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Edition:
2017, Cambridge University Press CUP
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Details:
ISBN:
1107120683
ISBN-13:
9781107120686
Publisher:
Cambridge University Press CUP
Published:
2017
Language:
English
Alibris ID:
18008029981
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New. P 320.
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Edition:
2017, Cambridge University Press
New
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ISBN:
1107120683
ISBN-13:
9781107120686
Publisher:
Cambridge University Press
Published:
2017
Language:
English
Alibris ID:
17943255366
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Brand New. New Book Original US edition, We Ship to PO BOX Address also.
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