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ISBN: 0818665327 /
ISBN-13: 9780818665325
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A Probabilistic Analysis of Test Response Compaction
by Slawomir Pilarski Tiko Kameda
1995, Institute of Electrical & Electronics Engineers(IEEE)
ISBN-13:
9780818665325
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- Edition:
- 1995, Institute of Electrical & Electronics Engineers(IEEE)
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Paperback,
Good
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- Details:
- ISBN:
0818665327
- ISBN-13:
9780818665325
- Edition:
first
- Publisher:
Institute of Electrical & Electronics Engineers(IEEE)
- Published:
1995
- Language:
English
- Alibris ID:
14460763155
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- Seller's Description:
- Good. [ No Hassle 30 Day Returns ] [ Edition: first ] Publisher: Institute of Electrical & Electronics Enginee Pub Date: 3/1/1995 Binding: Paperback Pages: 95.
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- Edition:
- 1995, Institute of Electrical & Electr
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Paperback,
Good
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- Details:
- ISBN:
0818665327
- ISBN-13:
9780818665325
- Publisher:
Institute of Electrical & Electr
- Published:
1995
- Language:
English
- Alibris ID:
17486276157
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- Shipping Options:
- Standard Shipping: $4.74
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- Good. Satisfaction 100% guaranteed.
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- Edition:
- 1995, IEEE Computer Society
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Paperback,
Good
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- Details:
- ISBN:
0818665327
- ISBN-13:
9780818665325
- Publisher:
IEEE Computer Society
- Published:
1995
- Language:
English
- Alibris ID:
17905355378
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- Shipping Options:
- Standard Shipping: $4.74
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- Seller's Description:
- Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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