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- ISBN: 9780123739735
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ISBN: 012373973X /
ISBN-13: 9780123739735
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System-On-Chip Test Architectures: Nanometer Design for Testability Volume .
by Wang, Laung-Terng, and Stroud, Charles E, and Touba, Nur A
2007, Morgan Kaufmann Publishers
ISBN-13:
9780123739735
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Booksplease
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- Edition:
- 2007, Morgan Kaufmann Publishers
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Hardcover,
New
- Available Copies: 5
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- Details:
- ISBN:
012373973X
- ISBN-13:
9780123739735
- Publisher:
Morgan Kaufmann Publishers
- Published:
2007
- Language:
English
- Alibris ID:
18023676492
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- Seller's Description:
- New. Sewn binding. Paper over boards. 896 p. Contains: Line drawings, black & white, Figures. Systems on Silicon.
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System-on-Chip Test Architectures: Nanometer Design for Testability (Volume. ) (Systems on Silicon, Volume. )
by Wang, Laung-Terng
2007, Morgan Kaufmann
ISBN-13:
9780123739735
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$92.19
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- Edition:
- 2007, Morgan Kaufmann
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Good
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- Details:
- ISBN:
012373973X
- ISBN-13:
9780123739735
- Publisher:
Morgan Kaufmann
- Published:
2007
- Language:
English
- Alibris ID:
17903771557
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- Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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System-on-Chip Test Architectures: Nanometer Design for Testability: Volume. (Systems on Silicon, Volume. )
by Laung-Terng Wang
2007, Morgan Kaufmann
ISBN-13:
9780123739735
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Bonita
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Newport Coast,
CA,
USA
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$187.59
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- Edition:
- 2007, Morgan Kaufmann
-
Hardcover,
New
|
- Details:
- ISBN:
012373973X
- ISBN-13:
9780123739735
- Publisher:
Morgan Kaufmann
- Published:
2007
- Language:
English
- Alibris ID:
18117315388
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- Shipping Options:
- Standard Shipping: $4.78
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- New.
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