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ISBN: 0123705975 /
ISBN-13: 9780123705976
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Vlsi Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Wang, Laung-Terng
2006, Morgan Kaufmann
ISBN-13:
9780123705976
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$108.06
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- Edition:
- 2006, Morgan Kaufmann
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Hardcover,
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- Details:
- ISBN:
0123705975
- ISBN-13:
9780123705976
- Publisher:
Morgan Kaufmann
- Published:
2006
- Language:
English
- Alibris ID:
17850232089
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Vlsi Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing; Abdel-Hafez, Khader S. [Contributor]; Bhattacharya, Soumendu [Contributor];...
2006, Morgan Kaufmann
ISBN-13:
9780123705976
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TEXTSHUB
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Franklin Lakes,
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$133.18
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- Edition:
- 2006, Morgan Kaufmann
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Hardcover,
Good
- Available Copies: 2
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- Details:
- ISBN:
0123705975
- ISBN-13:
9780123705976
- Publisher:
Morgan Kaufmann
- Published:
07/2006
- Language:
English
- Alibris ID:
17581317283
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- Seller's Description:
- Good. Textbook, May Have Highlights, Notes and/or Underlining, BOOK ONLYNO ACCESS CODE, NO CD, Ships with Emailed Tracking.
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Hardcover,
Good
Vlsi Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing; Abdel-Hafez, Khader S. [Contributor]; Bhattacharya, Soumendu [Contributor];...
2006, Morgan Kaufmann
ISBN-13:
9780123705976
See Item Details ▾
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Book Words
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Midland Park,
NJ,
USA
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$136.95
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|
- Edition:
- 2006, Morgan Kaufmann
-
Hardcover,
Good
- Available Copies: 2
|
- Details:
- ISBN:
0123705975
- ISBN-13:
9780123705976
- Publisher:
Morgan Kaufmann
- Published:
07/2006
- Language:
English
- Alibris ID:
17602243114
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- Shipping Options:
- Standard Shipping: $4.80
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- Seller's Description:
- Good. USED-VARIOUS AMOUNTS OF WEAR-POSSIBLE HIGHLIGHTS-WE CANNOT GUARANTEE SUPPLEMENTS SUCH AS CD, ACCESS CODE, OR INFO TRAC.
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