Edition
ISBN: 0123705975 /
ISBN-13: 9780123705976
- Book Details
- Seller
-
-
Hardcover,
New
VLSI Test Principles and Architectures: Design for Testability
by Wang, Laung-Terng, and Wu, Cheng-Wen, and Wen, Xiaoqing
2006, Morgan Kaufmann Publishers
ISBN-13:
9780123705976
See Item Details ▾
|
Booksplease
HIGH
Southport,
MERSEYSIDE,
UNITED KINGDOM
|
$92.03
|
|
- Edition:
- 2006, Morgan Kaufmann Publishers
-
Hardcover,
New
- Available Copies: 5
|
- Details:
- ISBN:
0123705975
- ISBN-13:
9780123705976
- Publisher:
Morgan Kaufmann Publishers
- Published:
2006
- Language:
English
- Alibris ID:
17937829289
|
- Shipping Options:
- Standard Shipping: $4.61
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New. Sewn binding. Cloth over boards. 808 p.
|
|
Hide Details ▴ |
-
Hardcover,
New
Vlsi Test Principles and Architectures: Design for Testability
by Wang, Laung-Terng (Editor)/ Wu, Cheng-Wen (Editor)/ Wen, Xiaoqing (Editor)
2006, Morgan Kaufmann Pub
ISBN-13:
9780123705976
See Item Details ▾
|
Revaluation Books
HIGH
Exeter,
DEVON,
UNITED KINGDOM
|
$92.38
|
|
- Edition:
- 2006, Morgan Kaufmann Pub
-
Hardcover,
New
- Available Copies: 2
|
- Details:
- ISBN:
0123705975
- ISBN-13:
9780123705976
- Publisher:
Morgan Kaufmann Pub
- Published:
2006
- Language:
English
- Alibris ID:
17629122351
|
- Shipping Options:
- Standard Shipping: $4.61
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New. 1st edition. 777 pages. 9.25x7.50x2.00 inches.
|
|
Hide Details ▴ |
-
Hardcover,
New
Vlsi Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing; Abdel-Hafez, Khader S. [Contributor]; Bhattacharya, Soumendu [Contributor];...
2006, Morgan Kaufmann
ISBN-13:
9780123705976
See Item Details ▾
|
GridFreed
HIGH
North Las Vegas,
NV,
USA
|
$121.19
|
|
- Edition:
- 2006, Morgan Kaufmann
-
Hardcover,
New
|
- Details:
- ISBN:
0123705975
- ISBN-13:
9780123705976
- Publisher:
Morgan Kaufmann
- Published:
2006
- Language:
English
- Alibris ID:
17508325827
|
- Shipping Options:
- Standard Shipping: $4.61
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New. Size: 129x32x150; New. In shrink wrap. Looks like an interesting title!
|
|
Hide Details ▴ |
-
Hardcover,
New
Vlsi Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Wang, Laung-Terng
2006, Morgan Kaufmann
ISBN-13:
9780123705976
See Item Details ▾
|
Bonita
HIGH
Newport Coast,
CA,
USA
|
$189.75
|
|
- Edition:
- 2006, Morgan Kaufmann
-
Hardcover,
New
|
- Details:
- ISBN:
0123705975
- ISBN-13:
9780123705976
- Publisher:
Morgan Kaufmann
- Published:
2006
- Language:
English
- Alibris ID:
17850232090
|
- Shipping Options:
- Standard Shipping: $4.61
Choose your shipping method in Checkout. Costs may vary based on destination.
|
- Seller's Description:
- New.
|
|
Hide Details ▴ |
|
|
|
|