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1. Scanning Electron Microscopy and X-Ray Microanalysis
by Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.
Seller Description: New. Size: 8x1x11; New Textbook, Ships with Tracking. See More Details
2017, Springer
ISBN-13: 9781493966745
hardcover, New
Franklin Lakes, NJ, USA
$218.72
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2. Scanning Electron Microscopy and X-Ray Microanalysis
by Goldstein, Joseph I.
Seller Description: New. See More Details
2018, Springer
ISBN-13: 9781493982691
paperback, New
Newport Coast, CA, USA
$220.87
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