Jeffrey M Wooldridge

Jeffrey M. Wooldridge is University Distinguished Professor of Economics at Michigan State University, where he has taught since 1991. From 1986 to 1991, he was an assistant professor of economics at the Massachusetts Institute of Technology. He received his bachelor of arts, with majors in computer science and economics, from the University of California, Berkeley, in 1982, and received his doctorate in economics in 1986 from the University of California, San Diego. He has published more than...See more

Jeffrey M. Wooldridge is University Distinguished Professor of Economics at Michigan State University, where he has taught since 1991. From 1986 to 1991, he was an assistant professor of economics at the Massachusetts Institute of Technology. He received his bachelor of arts, with majors in computer science and economics, from the University of California, Berkeley, in 1982, and received his doctorate in economics in 1986 from the University of California, San Diego. He has published more than 60 articles in internationally recognized journals, as well as several book chapters. He is also the author of Econometric Analysis of Cross Section and Panel Data, second edition. His awards include an Alfred P. Sloan Research Fellowship, the Plura Scripsit award from Econometric Theory, the Sir Richard Stone prize from the Journal of Applied Econometrics, and three graduate teacher-of-the-year awards from MIT. He is a fellow of the Econometric Society and of the Journal of Econometrics. He is past editor of the Journal of Business and Economic Statistics, and past econometrics coeditor of Economics Letters. He has served on the editorial boards of Econometric Theory, the Journal of Economic Literature, the Journal of Econometrics, the Review of Economics and Statistics, and the Stata Journal. He has also acted as an occasional econometrics consultant for Arthur Andersen, Charles River Associates, the Washington State Institute for Public Policy, Stratus Consulting, and Industrial Economics, Incorporated. See less