Dr. John E Eck

John E. Eck is Professor of Criminal Justice at the University of Cincinnati, where he teaches police effectiveness and crime prevention. He received his bachelor's and master's degrees from the University of Michigan, and his doctorate from the University of Maryland's Department of Criminology. Professor Eck has conducted research into police operations since 1977, and served as the Research Director for the Police Executive Research Forum (PERF). At PERF, he spearheaded the development of...See more

John E. Eck is Professor of Criminal Justice at the University of Cincinnati, where he teaches police effectiveness and crime prevention. He received his bachelor's and master's degrees from the University of Michigan, and his doctorate from the University of Maryland's Department of Criminology. Professor Eck has conducted research into police operations since 1977, and served as the Research Director for the Police Executive Research Forum (PERF). At PERF, he spearheaded the development of problem-oriented policing throughout the U.S. He was also the Evaluation Coordinator for Law Enforcement at the Washington/Baltimore High Intensity Drug Trafficking Area, and a consultant to the London Metropolitan Police, Royal Canadian Mounted Police, Police Foundation, and other organizations. His research has focused on the development of problem-oriented policing, police effectiveness, crime patterns, and crime prevention. He is particularly interested in concentrations of crime in very small areas, how these form, and what can be done to prevent crime at these places. Professor Eck was a member of the National Academy of Science's Committee to Review Research on Police Policy and Practices. He is the coauthor (with Ronald Clarke) of Crime Analysis for Problem-Solvers: In 60 Small Steps , as well as the coauthor of many publications on problem-oriented policing, crime mapping, crime prevention, and problem places. He is a coauthor of the forthcoming Place Matters: Criminology for the 21 st Century (Cambridge University Press). See less