Basel Halak

Dr Basel Halak is the director of the embedded systems and IoT program at the University of Southampton, a visiting scholar at the Technical University of Kaiserslautern, a visiting professor at the Kazakh-British Technical University, a fellow of the royal academy of engineering, a national teaching fellow of Advance HE in the UK, and a senior fellow of the higher education academy. He has written over 80-refereed conference and journal papers, and authored two books, including the first...See more

Dr Basel Halak is the director of the embedded systems and IoT program at the University of Southampton, a visiting scholar at the Technical University of Kaiserslautern, a visiting professor at the Kazakh-British Technical University, a fellow of the royal academy of engineering, a national teaching fellow of Advance HE in the UK, and a senior fellow of the higher education academy. He has written over 80-refereed conference and journal papers, and authored two books, including the first textbook on Physically Unclonable Functions. His research expertise include evaluation of security of hardware devices, development of appropriate countermeasures, the development of mathematical formalisms of reliability issues in CMOS circuits (e.g. crosstalk, radiation, ageing), and the use of fault tolerance techniques to improve the robustness of electronics systems against such issues.. Dr Halak lectures on digital design, Secure Hardware and Cryptography. He is also leading European Masters in Embedded Computing Systems (EMECS), a two year course run in collaboration with Kaiserslautern University in Germany and the Norwegian University of Science and Technology in Trondheim (electronics and communication). Dr Halak serves on several technical program committees such as HOST, IEEE DATE, IVSW, ICCCA, ICCCS, MTV and EWME. He is an associate editor of IEEE access and an editor of the IET circuit devices and system journal. He is also a member of the hardware security-working group of the World Wide Web Consortium (W3C). See less