The Physics of Sio2 and Its Interfaces: Proceedings of the International Topical Conference on the Physics of Si02 and Its Interfaces, Held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978

Deep Centers in Semiconductors

Molecular Electronics: Volume 582

Computer-Based Microscopic Description of the Structure and Properties of Materials: Symposium Held December 2-4, 1985, Boston, Massachusetts, U.S.A.

Proceedings of the Second International Symposium on Process Physics and Modeling in Semiconductor Technology

Deep Centers in Semiconductors